Test Probe 18 of IEC 61032 Test Probe

Photos

EN61032 Figure 12 - Jointed Child Finger Test Probe 18 of Small Finger Probe 8,6 mm (36 months~14 years old)

IEC61032 Test Probe 18, Children Test Finger Probe

This probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.

Conforms to:

Standard IEC61032-1997.

Technology Parameter:

Knurled finger diameter	8.6mm
Head radius	4.3mm
Knurled finger length	57.9mm (three knurls, 19.3mm/knurl)

Note:

The extension of the handle represents the arm of the child. And the handle is provided with an extension 451.6mm long, and the probe should be applied with or without this extension, whichever is the more onerous condition.

Both joints shall permit movement in the same plane and the same direction through an angle of 90o..

test probe 18

Company introduction

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.

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If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.

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